IEC 63155:2020定义了用于确定射频(RF)声表面波(SAW)和体声波(BAW)设备（例如滤波器和双工器）相对于高功率RF信号的耐久性的测量方法，这些设备用于电信、测量设备、雷达系统和消费产品。射频BAW器件包括两种类型:基于薄膜体声学谐振器（FBAR）技术的器件和基于固体安装谐振器（SMR）技术的器件。 本文件包括RF SAW/BAW设备故障的基本属性，以及建立测量系统和建立估计故障时间（TF）程序的指南。由于TF主要由施加在设备中的RF功率决定，因此讨论集中在功率耐久性上。本文档的目的不是解释该理论，也不是试图涵盖实际情况中可能出现的所有可能性。本文档提请注意用户在为新应用订购RF SAW/BAW器件之前需要考虑的一些更基本的问题。这种程序将是用户防止与RF SAW/BAW设备的高功率暴露导致的过早设备故障相关的不令人满意的性能的手段。

IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.