IEC？TR？62240-2:2018（E）描述了通过确保数字半导体微电路的寿命与航空航天、国防和高性能（ADHP）应用（通常与功能环境相关）的要求兼容来选择数字半导体微电路的过程和方法。提供了评估此类应用中COTS半导体微电路长期可靠性的方法和指南；在选择半导体微电路和评估应用可靠性时，它们主要适用于电子设计阶段。专注于使用商用现货（COTS）半导体微电路的原始设备制造商（OEM），以实现高性能、高可靠性和长时间应用。本文件支持原始设备制造商编制和维护其半导体电子元件管理计划（ECMP）。

IEC？TR？62240-2:2018(E) describes a process and a method for selecting digital semiconductor microcircuits by ensuring that their lifetime is compatible with the requirements of aerospace, defence and high performance (ADHP) applications (generally in connection with functional environments). Methods and guidelines are provided to assess the long term reliability of COTS semiconductor microcircuits in such applications; they mainly apply during the electronic design phase when selecting semiconductor microcircuits and assessing the application reliability. focuses on original equipment manufacturers (OEMs) using commercial off the shelf (COTS) semiconductor microcircuits for high performance, high reliability and long duration applications. This document supports OEMs in the preparation and maintenance of their semiconductor electronic component management plan (ECMP).