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现行 BS EN 62276:2016
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Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods 用于声表面波(SAW)设备应用的单晶片 规范和测量方法
发布日期: 2016-12-31
交叉引用:IEC 60758:2016ISO 2859-1:1989EN 60758:2016IEC 60862-1IEC 60862-2IEC 60862-3IEC 61019-1IEC 61019-2IEC 61019-3ISO 4287:1997ANSI/IEEE Std 176-1987ASTM F533SEMI M1-1296EN 61019-1EN 61019-2EN 61019-3EN ISO 4287:1998购买本文件时可提供的所有当前修订件。
Cross References:IEC 60758:2016ISO 2859-1:1989EN 60758:2016IEC 60862-1IEC 60862-2IEC 60862-3IEC 61019-1IEC 61019-2IEC 61019-3ISO 4287:1997ANSI/IEEE Std 176-1987ASTM F533SEMI M1-1296EN 61019-1EN 61019-2EN 61019-3EN ISO 4287:1998All current amendments available at time of purchase are included with the purchase of this document.
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发布单位或类别: 英国-英国标准学会
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