描述了一种测量集成电路（IC）在传导射频干扰情况下的抗扰度的方法，例如由辐射射频干扰引起的抗扰度。该方法保证了免疫测量的高度可重复性和相关性。 本标准为评估在受有害射频电磁波影响的环境中运行的设备中使用的半导体器件奠定了共同基础。

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.