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Optics and photonics — Measurement method of semiconductor lasers for sensing 光学和光子学 - 用于感测的半导体激光器的测量方法
发布日期: 2018-05-25
本文件描述了测量温度和注入电流对激光波长的依赖性,以及与传感应用半导体激光器有关的激光光谱线宽的方法。 本文件适用于所有类型的半导体激光器,如边缘发射型和垂直腔表面发射型激光器、体型和(应变)量子阱激光器,以及用于工业、医疗和农业领域的光学传感的量子级联激光器。
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications. This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
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归口单位: ISO/TC 172/SC 9
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