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现行 BS QC 790101:1992
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Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits 电子元件质量评定协调体系 半导体器件 集成电路 不包括混合电路的半导体集成电路分规范 半导体集成电路(不包括混合电路)的内部目视检查
发布日期: 1992-08-15
检查集成电路内部材料、结构和工艺是否符合适用规范要求的测试。交叉引用:IEC 343IEC 344IEC 345IEC 346IEC 347IEC 348IEC 349IEC 350IEC 351IEC 352IEC 353IEC 354IEC 356IEC 357IEC 358IEC 359IEC 360IEC 361IEC 362
Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.Cross References:IEC 343IEC 344IEC 345IEC 346IEC 347IEC 348IEC 349IEC 350IEC 351IEC 352IEC 353IEC 354IEC 355IEC 356IEC 357IEC 358IEC 359IEC 360IEC 361IEC 362
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发布单位或类别: 英国-英国标准学会
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