IEC 61280-2-2:2012（E）描述了一种测试程序，用于验证是否符合预定波形遮罩，并测量眼图和波形参数，如上升时间、下降时间、调制幅度和消光比。第四版取消并取代2008年出版的第三版，构成技术修订版。与上一版相比，本版包括以下重大技术变更:附加定义；试验程序的澄清。 关键词:光学眼图、波形、调制幅度、消光比

IEC 61280-2-2:2012(E) describes a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation amplitude and extinction ratio. This fourth edition cancels and replaces the third edition published in 2008 and constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition: additional definitions; clarification of test procedures. Keywords: optical eye pattern, waveform, modulation amplitude, extinction ratio