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现行 MIL MIL-PRF-55365G Amendment 3(all prev amd incorp.)
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Capacitor, Fixed, Electrolytic (Tantalum), Chip, Established Reliability, Nonestablished Reliability, and High Reliability, General Specification for 片式固定电解(钽)电容器 既有可靠性、非既有可靠性和高可靠性 通用规范
发布日期: 2010-09-16
本规范涵盖了非确定可靠性(non ER)、确定可靠性(ER)和高可靠性钽介质固定片式电容器的一般要求,主要用于厚膜和薄膜混合电路或表面贴装应用中的滤波器、旁路、耦合、,以及交流(ac)组件比直流(dc)额定电压小的其他应用,以及可提供补充水分保护的应用(见6.1)。根据MIL-STD-690,在+85åC的规定电压下进行的寿命试验,确定了可靠性电容器的可靠性等级,故障率等级(FRL)范围为:a.每1000小时1.0%到每1000小时0.001%。这些FRL建立在60%的置信水平,并保持在10%的置信水平- 生产者风险百分比(指数分布)。b、 每1000小时0.1%到每1000小时0.001%,或在90%置信水平(威布尔分布)下1次拟合(拟合=故障单元=每109个设备小时一次故障)。
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc) rated voltage and where supplemental moisture protection is available (see 6.1). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85å¡C for failure rate levels (FRL) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL‰Ûªs are established at a 60-percent confidence level and are maintained at a 10-percent producer‰Ûªs risk (exponential distribution). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT (FIT = failure unit = one failure per 109 device hours) at 90-percent confidence level (Weibull distribution).
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发布单位或类别: 美国-美国军事规范和标准
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