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现行 MIL MIL-PRF-55365H Amendment 2(all prev amd incorp.)
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Capacitor, Fixed, Electrolytic (Tantalum), Chip, Established Reliability, Nonestablished Reliability, and High Reliability, General Specification for 固定式电解(钽)片式电容器 确定可靠性、非确定可靠性和高可靠性 通用规范
发布日期: 2013-12-21
本规范涵盖了非确定可靠性(non-ER)、确定可靠性(ER)和高可靠性钽电介质固定片电容器的一般要求,主要用于厚膜和薄膜混合电路或表面安装应用,用于滤波器、旁路、耦合和其他应用,其中交流(ac)分量与直流(dc)额定电压相比较小,并且可以提供补充防潮保护(见6.1)。已建立的可靠性电容器的可靠性额定值基于在+85åC的指定电压下进行的寿命测试,故障率水平(FRL)范围为:a.根据MIL-STD-690,每1000小时1.0%至每1000小时0.001%。这些FRL在60%的置信水平下建立,并保持在10%的生产者风险(指数分布)下。 b.在90%置信水平(威布尔分布)下,每1000小时0.1%至每1000小时0.001%或1个FIT(FIT=故障单位=每109个设备小时一个故障)。
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc) rated voltage and where supplemental moisture protection is available (see 6.1). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85å¡C for failure rate levels (FRL) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL‰Ûªs are established at a 60-percent confidence level and are maintained at a 10-percent producer‰Ûªs risk (exponential distribution). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT (FIT = failure unit = one failure per 109 device hours) at 90-percent confidence level (Weibull distribution).
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发布单位或类别: 美国-美国军事规范和标准
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