1.1 本指南涵盖了过度测试的使用，以减少必须测试以满足给定质量验收标准的所需零件数量。过度测试是在高于其规格应力的应力水平下测试零件的样本数量，以减少必要的数据采集量。本指南讨论了何时以及如何应用过度测试来形成受辐射应力影响的电子零件存活的概率估计。虽然准确的知识可能会被过度的知识所取代，但控制零件失效应力的概率分布的一些知识是必要的- 这种分布的保守估计。 1.2 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 5.1 过度测试应在以下情况下进行:( 一 )由于时间和成本的考虑，或者由于无法以足够的精度估计应力到失效的概率分布，通过变量进行测试是不切实际的，并且( b )大量不切实际的零件必须在规范压力下进行测试，以获得必要的置信度和生存概率。

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution. 1.2 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 5.1 Overtesting should be done when ( a ) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and ( b ) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.