本技术报告对瞬时闭锁状态进行了全面总结。希望通过汇编有关该主题的知识状况摘要，能够明确是否需要进行一次瞬态闭锁测试，或者一组小的应力测试是否可以覆盖大部分在暴露于瞬态信号时具有闭锁灵敏度的集成电路。

This technical report provides a comprehensive summary of the state of transient latch-up. It was hoped that by compiling a summary of the state of knowledge on the subject, it would make it clear whether a single transient latch-up test was needed or if a small set of stress tests could cover a large fraction of the integrated circuits which have latch-up sensitivity when exposed to transient signals.