Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
电子元件质量评定协调体系 半导体器件 光电器件分规范
Test and measurement procedures, inspection requirements together with associated screening and sampling requirements, and quality assessment procedures to be used in preparing detail specifications for optoelectronic devices in accordance with the appropriate blank detail specification.Cross References:BS 2011:Part 2.2NBS 3934:Part 1BS 3934:Part 2BS 6001:Part 1BS 6493:Section 1.1BS 6493:Section 1.2BS 6493:Section 1.3BS 6493:Section 1.5BS 9000:Part 3BS QC 001 002BS QC 700000