IEC 63185:2020涉及微波和毫米波频率下介质基板复介电常数的测量方法。该方法用于评估微波和毫米波电路和器件中使用的低损耗材料的介电性能。它使用平衡型圆盘谐振器的高阶模式，并通过使用一个谐振器提供介质衬底的宽带测量，其中在模式匹配分析的基础上精确地考虑了激发孔的影响。

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.