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现行 IEC 62562:2010
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Cavity resonator method to measure the complex permittivity of low-loss dielectric plates 谐振腔法测量低损耗介质板的复介电常数
发布日期: 2010-02-18
IEC 62562:2010描述了一种微波频率下介质板平面方向介电特性的测量方法,称为腔谐振器法。它是为了开发新材料和设计微波有源和无源器件而创建的,为此,材料特性测量方法的标准化变得越来越重要。这第一版取消并取代了2008年出版的PAS。2010-05年出版的双语版本与英文版相对应。 本出版物包含被认为有助于正确理解其内容的颜色。
IEC 62562:2010 describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency, called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-05, corresponds to the English version.

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归口单位: TC 46/SC 46F
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