BS EN ISO 25178-607:2019描述了共焦的影响量和仪器特性
用于表面形貌面积测量的显微镜系统。因为曲面轮廓可以
从表面形貌图像中提取,本文档中描述的方法可应用于
分析测量也是如此。交叉引用:ISO 25178-602:2010ISO 25178-600:2019ISO 25178-6:2010ISO 14638购买本文件时提供的所有当前修订版均包含在购买本文件中。
BS EN ISO 25178-607:2019 describes the influence quantities and instrument characteristics of confocal
microscopy systems for areal measurement of surface topography. Because surface profiles can be
extracted from surface topography images, the methods described in this document can be applied to
profiling measurements as well.Cross References:ISO 25178-602:2010ISO 25178-600:2019ISO 25178-6:2010ISO 14638All current amendments available at time of purchase are included with the purchase of this document.