ISO 25178的这一部分涉及符合ISO 5436-1和ISO 25178-70标准的材料测量和校准样品表面上可能存在的几何缺陷。它定义了这些几何缺陷的类，并定义了对这些缺陷进行响应的方法。 ISO 25178的这一部分适用于: a）帮助客户和用户进行表面计量的材料措施，从制造商和供应商处购买时，确定其名义特征（理想几何属性）; b）使物质措施用户能够制定自己的规则和政策，以应对缺陷的发生，以尽量减少自身测量的不确定性。 c）使校准实验室及其客户能够就如何处理已经发送校准的物质措施上的缺陷达成共同的政策; d）教育用户对不同缺陷的不同意义和重要性的物质措施; e）对于参考测量位置选择问题的其他GPS标准，或测量区域的选择或在测量中要避免的情况

This document defines classes of geometrical defects that might be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70, and defines terms for ways of responding to these defects. This document is applicable as follows: a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when obtaining them from manufacturers and suppliers; b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimize the uncertainty of their own measurements; NOTE Such policies are required in ISO/IEC 17025:2017, 7.2.1.1, 7.2.1.3, 7.3.1 and 7.8.5 c) and d), for example. c) to enable calibration laboratories and their customers to agree on a common policy on how to treat defects on a material measure that has been sent for calibration; d) to educate users of material measures about the different significance and importance of different kinds of defect; e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or avoided in measurement.