本文件定义了符合ISO 5436-1和ISO 25178-70的材料测量和校准样品表面可能存在的几何缺陷类别，并定义了应对这些缺陷的方法术语。 本文件适用于以下情况: a） 在从制造商和供应商处获取材料时，帮助表面计量材料测量的客户和用户指定其标称特征（理想几何特性）； b） 使材料测量的使用者能够制定自己的规则和政策，以应对缺陷的发生，从而最大限度地减少自己测量的不确定性； 注:ISO/IEC 17025:2017、7.2.1.1、7.2.1.3、7.3.1和7中要求此类政策。 例如，8.5 c）和d）。 c） 使校准实验室及其客户能够就如何处理已发送进行校准的材料测量的缺陷达成共识； d） 教育材料测量的使用者了解不同类型缺陷的不同意义和重要性； e） 对于其他GPS标准，涉及测量位置的选择，或测量中要测量或避免的区域的选择。

This document defines classes of geometrical defects that might be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70, and defines terms for ways of responding to these defects. This document is applicable as follows: a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when obtaining them from manufacturers and suppliers; b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimize the uncertainty of their own measurements; NOTE Such policies are required in ISO/IEC 17025:2017, 7.2.1.1, 7.2.1.3, 7.3.1 and 7.8.5 c) and d), for example. c) to enable calibration laboratories and their customers to agree on a common policy on how to treat defects on a material measure that has been sent for calibration; d) to educate users of material measures about the different significance and importance of different kinds of defect; e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or avoided in measurement.