现行

BS ISO 15932-2013

Microbeam analysis. Analytical electron microscopy. Vocabulary
微束分析 分析电子显微镜 词汇

2013-12-31

现行

GB/T 40300-2021

微束分析 分析电子显微学 术语
Microbeam analysis—Analytical electron microscopy—Vocabulary

2021-08-20

现行

ISO 15932-2013

Microbeam analysis — Analytical electron microscopy — Vocabulary
微束分析——分析电子显微镜——词汇

2013-12-13

现行

ISO 19214-2024

Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
微束分析 分析电子显微镜 用透射电子显微镜测定纳米晶体表观生长方向的方法

2024-10-16

现行

BS ISO 25498-2018

Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
微束分析 分析电子显微镜 用透射电子显微镜进行选区电子衍射分析

2018-03-23

现行

GB/T 18907-2013

微束分析 分析电子显微术 透射电镜选区电子衍射分析方法
Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

2013-07-19

现行

ISO 25498-2018

Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
微束分析 - 分析电子显微镜 - 使用透射电子显微镜的选择区域电子衍射分析

2018-03-16

现行

GB/T 43610-2023

微束分析 分析电子显微术 线状晶体表观生长方向的透射电子显微术测定方法
Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

2023-12-28

现行

GB/T 43883-2024

微束分析 分析电子显微术 金属中纳米颗粒数密度的测定方法
Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal

2024-04-25

现行

BS ISO 23420-2021

Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
微束分析 分析电子显微镜 电子能量损失谱分析中能量分辨率的测定方法

2021-05-05

现行

ISO 23420-2021

Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
微束分析.分析电子显微镜.电子能量损失谱分析用能量分辨率的测定方法

2021-04-23

现行

ISO 24639-2022

Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
微束分析.分析电子显微镜.用电子能量损失光谱法进行元素分析的能量标度校准程序

2022-07-05

现行

ISO/TS 21383-2021

Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements
用于定量测量的扫描电子显微镜鉴定

2021-03-12

现行

BS ISO 20263-2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
微束分析 分析电子显微镜 分层材料横截面图像中界面位置的确定方法

2018-01-04

现行

GB/T 43087-2023

微束分析 分析电子显微术 层状材料截面像中界面位置的确定方法
Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials

2023-09-07

现行

ISO 20263-2024

Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
微束分析 - 分析透射电子显微镜 - 分层材料横截面图像中界面位置的测定方法

2024-11-06

现行

ISO 29301-2023

Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
微束分析分析分析电子显微镜用周期结构参考材料校准图像放大率的方法

2023-10-16

现行

GB/T 34002-2017

微束分析 透射电子显微术 用周期结构标准物质校准图像放大倍率的方法
Microbeam analysis—Analytical transmission electron microscopy—Methods for calibrating image magnification by using reference materials having periodic structures

2017-07-12

现行

GB/T 43748-2024

微束分析 透射电子显微术 集成电路芯片中功能薄膜层厚度的测定方法
Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips

2024-03-15