本公告解释了双稳态半导体微电路的术语和测量方法。它还打算与半导体集成双稳态逻辑电路的EIA注册数据格式一起使用。

This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.