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现行 MIL MIL-PRF-55681G
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Capacitor, Chip, Multiple Layer, Fixed Ceramic Dielectric, Established Reliability and Non-Established Reliability, General Specification for 片式多层固定陶瓷电介质电容器 既有可靠性和非既有可靠性 通用规范
发布日期: 2016-07-12
本规范涵盖了陶瓷介质多层片式电容器的非确定可靠性(非ER)和确定可靠性(ER)的一般要求。本规范涵盖的ER电容器的故障率水平(FRL)为每1000小时1.0%至0.001%。这些FRL建立在90%的置信水平上,维持在10%的生产商风险下,并基于在最大额定电压和最大额定温度下进行的寿命试验。 使用8:1的加速系数将在最大额定温度下200%额定电压下获得的寿命试验数据与额定温度下的额定电压联系起来。
This specification covers the general requirements for non-established reliability (non-ER) and established reliability (ER), ceramic dielectric, multiple layer, chip capacitors. ER capacitors covered by this specification have failure rate levels (FRL) ranging from 1.0 percent to 0.001 percent per 1,000 hours. These FRLs are established at a 90-percent confidence level and maintained at a 10 percent producer's risk and are based on life tests performed at maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature.
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发布单位或类别: 美国-美国军事规范和标准
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