IEC 60444的本部分适用于石英晶体元件驱动电平相关性（DLD）的测量。描述了两种试验方法（A和C）和一种参考方法（B）。根据IEC 60444-5，基于π网络的“方法A”可在IEC 60444本部分所涵盖的完整频率范围内使用。根据IEC 60444-5或IEC 60444-8，基于π网络或反射法的“参考方法B”可在IEC 60444本部分涵盖的完整频率范围内使用。“方法C”是一种振荡器方法，适用于在固定条件下大量测量基模晶体单元。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. "Reference Method B", based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. "Method C", an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.All current amendments available at time of purchase are included with the purchase of this document.