MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
半导体信号二极管反向恢复时间的测量
发布日期:
1996-07-01
本标准描述了持续时间小于300 ns的信号二极管(如果<=500 mA dc)反向恢复时间的测量。然而,它也可用于测量更长的恢复时间。本标准还旨在建立一种方法,用于描述用于该测量的测试夹具的特性。
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.