ISO 19840:2012规定了根据粗糙表面上的标称干膜厚度验证干膜厚度的程序，包括所用仪器的调整、检验区域的定义、取样计划、测量方法和验收/拒收标准。 该程序基于永磁体、电磁铁和涡流型仪器的使用。仪器精度在零度和光滑表面上的已知厚度下进行验证，必要时进行调整。 它不适用于小于40μm的标称干膜厚度。

ISO 19840:2012 specifies a procedure for the verification of dry-film thickness against nominal dry-film thickness on rough surfaces, including the adjustment of the instruments used, the definition of inspection areas, sampling plans, measurement methods and acceptance/rejection criteria. The procedure is based on the use of instruments of the permanent magnet, electromagnet and eddy current type. Instrument accuracy is verified both at zero and at a known thickness on a smooth surface and adjusted if necessary. It does not apply to nominal dry-film thicknesses less than 40 μm.