BS EN 61338-1-5:2015:微波电路通常在多层有机或非有机衬底上形成。在微波电路中，平面传输线（如带状线）的衰减， 微带线和共面线由它们的导体损耗、介电损耗和电阻决定 辐射损失。其中，导体损耗是影响电磁波衰减的主要因素 平面传输线。本文件标准化了一种新的测量方法，以 评估基板上或基板中传输线的导电性，如有机， 陶瓷和LTCC（低温共烧陶瓷）基板。本标准描述了 界面电阻和有效电导率的测量方法 导体层和电介质衬底，它们被称为界面电阻和界面电阻 导电性。这种测量方法具有以下特点:通过测量谐振频率f0和 图2所示的TE01δ模介质棒谐振器的空载品质因数qu；界面电导率σi和相对界面电导率σri=σi/σ0的计算公式如下: 测量值，其中σ0=5,8×107S/m是标准铜的电导率；σri（Δσri）的测量不确定度小于5%。交叉引用:IEC 61338-1-3IEC 62562EN 61338-1-3EN 62252购买本文件时可获得的所有现行修订均包含在购买本文件中。

BS EN 61338-1-5:2015: Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In the microwave circuits, the attenuation of planar transmission lines such as striplines, microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and radiation loss. Among them, the conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is standardized in this document to evaluate the conductivity of transmission line on or in the substrates such as the organic, ceramic and LTCC (low temperature co-fired ceramics) substrates. This standard describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.This measurement method has the following characteristics:the interface resistanceRiis obtained by measuring the resonant frequencyf0and unloaded quality factorQuof a TE01δmode dielectric rod resonator shown in Figure 2;the interface conductivityσiand the relative interface conductivity σri= σi/ σ0are calculated from the measuredRivalue, where σ0= 5,8 × 107S/m is the conductivity of standard copper;the measurement uncertainty of σri(Δσri) is less than 5 %.Cross References:IEC 61338-1-3IEC 62562EN 61338-1-3EN 62252All current amendments available at time of purchase are included with the purchase of this document.