IEC 62860:2013（E）涵盖了印刷晶体管和有机晶体管电气特性的推荐方法和标准化报告实践。由于印刷和有机电子学的性质，如果实验的电气特性设计没有得到适当的解决，可能会引入重大的测量误差。本标准描述了测量误差的最常见来源，尤其是印刷晶体管和有机晶体管通常需要的高阻抗电气测量。本标准还提供了推荐做法，以尽量减少和/或描述在测量印刷晶体管和有机晶体管时遇到的测量伪影和其他误差源的影响。 关键词:电气特性，FET，柔性电子，高阻抗，纳米复合材料，纳米技术，OFET，有机电子学，有机晶体管，印刷电子学，印刷，晶体管

IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor