Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
半导体器件 柔性可伸缩半导体器件
BS IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as
well as a test set-up for the measurement of barrier performance for thin-film layer with
ultra-low permeation rate under both flat and bending conditions. This document also includes
the preparation of specimen, electrical contacts, sensor films and calculation procedures. For
these purposes, this document provides terms, definitions, symbols, configurations, and test
methods including test conditions such as temperature, relative humidity, testing time.Cross References:IEC 60115-1:2008ISO 15106-1:2003IEC 60749-39IEC 62812All current amendments available at time of purchase are included with the purchase of this document.