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Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor 半导体器件 柔性可伸缩半导体器件
发布日期: 2019-03-06
BS IEC 62951-7:2019规定了评估条件,并给出了如下测量方法: 以及测量薄膜层阻隔性能的测试装置 平坦和弯曲条件下的超低渗透率。本文件还包括 试样的制备、电触点、传感器薄膜和计算程序。对于 出于这些目的,本文件提供了术语、定义、符号、配置和测试 方法包括测试条件,如温度、相对湿度、测试时间。交叉引用:IEC 60115-1:2008ISO 15106-1:2003IEC 60749-39IEC 62812购买时可用的所有现行修订版均包含在本文件的购买中。
BS IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin-film layer with ultra-low permeation rate under both flat and bending conditions. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.Cross References:IEC 60115-1:2008ISO 15106-1:2003IEC 60749-39IEC 62812All current amendments available at time of purchase are included with the purchase of this document.
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发布单位或类别: 英国-英国标准学会
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