IEC 62951-6:2019-半导体器件.柔性和可拉伸的半导体器件.第6部分:柔性导电薄膜片电阻的试验方法-国家数字标准馆

现行 IEC 62951-6:2019

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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films 半导体器件.柔性和可拉伸的半导体器件.第6部分:柔性导电薄膜片电阻的试验方法

发布日期： 2019-05-06

IEC 62951-6:2019规定了弯曲和折叠试验下柔性导电膜的薄层电阻的术语、试验方法和报告。测量方法包括两点探针法、四点探针法和蒙哥马利法，可用于原位和非原位测量以及各向异性薄层电阻的测量。

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 31.080.99半导体分立器件 - 其他半导体分立器件

关联关系

研制信息

归口单位： TC 47

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KS C IEC 62951-1

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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
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