IEC 62951-2:2019-半导体器件.柔性和可伸展半导体器件.第2部分:柔性器件的电子迁移率、亚阈值摆幅和阈值电压的评估方法-国家数字标准馆

现行 IEC 62951-2:2019

到馆阅读

收藏跟踪

购买正版

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices 半导体器件.柔性和可伸展半导体器件.第2部分:柔性器件的电子迁移率、亚阈值摆幅和阈值电压的评估方法

发布日期： 2019-04-17

                IEC 62951-2:2019规定了可用于评估和确定柔性薄膜晶体管（TFT）设备性能特性的术语、定义、符号、配置和评估方法。本文件规定了在弯曲状态下准确评估柔性TFT器件在实际使用中的性能和可靠性的试验方法和特征参数。

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin？film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 31.080.99半导体分立器件 - 其他半导体分立器件

关联关系

研制信息

归口单位： TC 47

相似标准/计划/法规

DLS-MIL-STD-750F-2012

Test Methods For Semiconductor Devices
Test Methods For Semiconductor Devices

BS IEC 62951-4-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
半导体器件柔性可伸缩半导体器件

IEC 62951-8-2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
半导体器件.柔性和可拉伸半导体器件.第8部分:柔性电阻存储器的可拉伸性、柔性和稳定性的试验方法

BS IEC 62951-5-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for thermal characteristics of flexible materials
半导体器件柔性可伸缩半导体器件

IEC 62951-4-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
半导体器件.柔性和可伸展半导体器件.第4部分:柔性半导体器件衬底上柔性导电薄膜的疲劳评价

BS IEC 62951-6-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for sheet resistance of flexible conducting films
半导体器件柔性可伸缩半导体器件

IEC 62951-5-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
半导体器件.柔性和可伸展半导体器件.第5部分:柔性材料热特性的试验方法

BS IEC 62951-7-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
半导体器件柔性可伸缩半导体器件

IEC 62951-6-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
半导体器件.柔性和可拉伸的半导体器件.第6部分:柔性导电薄膜片电阻的试验方法

BS IEC 62951-2-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
半导体器件柔性可伸缩半导体器件

IEC 62951-1-2017

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
半导体器件 - 柔性和可拉伸半导体器件 - 第1部分:柔性基板上导电薄膜的弯曲试验方法

KS C IEC 62951-1

반도체소자 — 유연성 및 신축성 반도체소자 — 제1부: 유연성 기판의 전도성 박막에 대한 굽힘 시험방법
半导体器件.柔性和可拉伸半导体器件.第1部分:柔性衬底上导电薄膜的弯曲试验方法

IEC 62951-7-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
半导体器件.柔性和可拉伸半导体器件.第7部分:表征柔性有机半导体薄膜封装阻挡性能的试验方法

IEC 62951-3-2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
半导体器件 - 柔性和可拉伸半导体器件 - 第3部分:凸出下柔性基板上薄膜晶体管特性的评估

BS IEC 62830-8-2021

Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
半导体器件用于能量收集和发电的半导体器件

IEC 62951-9-2022

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
半导体器件.柔性和可拉伸半导体器件.第9部分:单晶体管和单电阻器（1T1R）电阻存储单元的性能测试方法

IEC 62830-8-2021

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
半导体器件.能量收集和发电用半导体器件.第8部分:低功率电子设备用柔性和可拉伸超级电容器的试验和评估方法

DIN EN 62951-1-DRAFT

Draft Document - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2224/CD:2015)
文件草稿.半导体器件.柔性和可拉伸半导体器件.第1部分:柔性衬底上导电薄膜的弯曲试验方法（IEC 47/2224/CD:2015）

BS IEC 60747-14-4-2011

Semiconductor devices. Discrete devices-Semiconductor accelerometers
半导体器件分立器件

BS IEC 60747-5-4-2022

Semiconductor devices-Optoelectronic devices. Semiconductor lasers
半导体器件.光电器件半导体雷射

《国家标准化发展纲要》提出建设国家数字标准馆，推动标准化工作向数字化、网络化、智能化转型。中国标准化研究院正在全力推进国家数字标准馆建设，力争在2026年底建成“一个中心”和“一个平台”，即全球领先的标准数据资源中心，涵盖标准全生命周期的数字化、网络化、智能化研究与服务平台。

关于我们

查新颖性

查有效性

跟踪标准

比对标准

专题数据库

标准管理系统

大数据分析系统

标准智能研制系统