IEC 63202-1:20 19描述了在模拟阳光下测量晶体硅光伏（PV）电池的光诱导退化（LID）的程序。晶体硅PV电池中LID的大小是通过比较在指定温度和辐照度下暴露于模拟阳光之前和之后在标准测试条件(STC)下的最大输出功率来确定的。 本文件的目的是提供标准化的光伏电池盖信息，以帮助光伏组件制造商最大限度地减少同一组件内电池之间的不匹配，从而最大限度地提高发电量。

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.