IEC 62899的本部分规定了用传输长度法（TLM）测量印刷薄膜晶体管（TFT）接触电阻的方法。该方法要求在源极和漏极之间制造具有不同沟道长度（L）的测试元件组（TEG）。该方法用于TFT电极触点的质量评估，适用于确定接触电阻是否在期望范围内。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This part of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.All current amendments available at time of purchase are included with the purchase of this document.