1.1所有显微镜都会出现伪影。本文件的目的是提供扫描隧道显微镜（STM）和原子力显微镜（AFM）中常见观察到的伪影的描述，这些伪影与探针运动和尖端与表面相互作用的几何因素有关，提供示例的文献参考，并在可能的情况下提供伪影来源的解释。由于扫描探针显微镜领域是一个新兴领域，本文件并不全面，而是作为一个指南，以实践显微镜可能存在的陷阱。 识别工件的能力应有助于可靠评估仪器操作和报告数据。 1.2此处将定义一组有限的术语。与STM和AFM仪器的描述、操作和校准相关的术语的完整描述超出了本文件的范围。

1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact. Because the scanned probe microscopy field is a burgeoning one, this document is not meant to be comprehensive but rather to serve as a guide to practicing microscopists as to possible pitfalls one may expect. The ability to recognize artifacts should assist in reliable evaluation of instrument operation and in reporting of data. 1.2 A limited set of terms will be defined here. A full description of terminology relating to the description, operation, and calibration of STM and AFM instruments is beyond the scope of this document.