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Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method 表面化学分析.扫描探针显微镜.用原子力显微镜和两点JKR法测定柔顺材料弹性模量的程序
发布日期: 2020-01-29
本文件描述了使用原子力显微镜(AFM)测定柔顺材料弹性模量的程序。测量了柔顺材料表面上的力-距离曲线,并使用基于Johnson-Kendall-Roberts(JKR)理论的两点法进行分析。本文件适用于弹性模量在100 kPa至1 GPa之间的兼容材料。空间分辨率取决于AFM探针和表面之间的接触半径,通常约为10-20 nm。
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
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归口单位: ISO/TC 201/SC 9
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