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现行 ISO 23729:2022
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Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size 表面化学分析.原子力显微镜.有限探针尺寸放大原子力显微镜图像的恢复程序指南
发布日期: 2022-07-13
本文件描述了原子力显微镜(AFM)探头尖端的定量表征程序,以及有限探头尺寸放大的AFM地形图像的恢复程序。使用合适的参考材料,通过图像重建提取探针顶点的三维形状。本文件适用于固体材料表面AFM地形图像的重建。
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
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归口单位: ISO/TC 201/SC 9
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