现行

MIL DSCC V62/04731

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTERS, MONOLITHIC SILICON
微电路 数字 高级双极CMOS 3.3伏ABT扫描测试设备 带18位收发器和寄存器 单片硅

2004-06-09

现行

MIL DESC 5962-94586

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS
微电路、数字、高级双极CMOS、带八进制总线收发器和寄存器的扫描测试设备、三态输出、TTL兼容输入

1994-04-22

现行

MIL DSCC V62/04729

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
微电路 数字 先进双极CMOS 3.3伏ABT扫描测试设备 18位通用总线收发器 单片硅

2004-06-09

现行

MIL DSCC V62/04730

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
微电路 数字 先进双极CMOS 3.3伏ABT扫描测试设备 18位通用总线收发器 单片硅

2004-06-09

现行

MIL DESC 5962-94672

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE
微电路、数字、高级双极CMOS、带18位通用总线收发器的扫描测试设备、三态输出、TTL兼容

1994-06-08

现行

MIL DESC 5962-94616

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS
微电路、数字、高级双极CMOS、带八进制总线收发器和寄存器的扫描测试设备、三态输出、TTL兼容输入

1994-04-26

现行

MIL DESC 5962-94615

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL REGISTERED BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS
微电路、数字、高级双极CMOS、带八进制注册总线收发器的扫描测试设备、三态输出、TTL兼容输入

1994-04-19

现行

MIL DESC 5962-91726

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUFFER, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制缓冲器的扫描测试设备 三态输出 单片硅

1994-01-06

现行

MIL DESC 5962-93186 Notice A-Revision

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
微电路 数字 高级双极CMOS 扫描测试设备 带八路总线收发器 具有三态输出 TTL兼容输入 单片硅

1994-03-11

现行

MIL DESC 5962-93186

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
微电路、数字、高级双极CMOS、带三态输出的八进制总线收发器的扫描测试设备、TTL兼容输入、单片硅

1994-01-24

现行

MIL DESC 5962-91728 Notice A-Revision

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制总线收发器的扫描测试设备 三态输出 单片硅

1994-05-02

现行

MIL DESC 5962-91746

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUFFER, INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制缓冲器的扫描测试设备 反转三态输出 单片硅

1994-06-10

现行

MIL DESC 5962-91728

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制总线收发器的扫描测试设备 三态输出 单片硅

1994-01-06

现行

MIL DESC 5962-96698

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER/REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
微电路、数字、高级双极CMOS、带18位收发器/寄存器的扫描测试设备、三态输出、TTL兼容输入、单片硅

1996-02-01

现行

MIL DESC 5962-94698

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
微电路、数字、高级双极CMOS、带18位收发器和寄存器的扫描测试设备、三态输出和TTL兼容输入、单片硅

1996-02-09

现行

MIL DESC 5962-91725

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE LATCH, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制D型锁存器的扫描测试设备 三态输出 单片硅

1994-01-06

现行

MIL DESC 5962-94601A

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-94601)
微电路、数字、高级双极CMOS、带18位总线收发器的扫描测试设备、三态输出、TTL兼容输入、单片硅（取代DESC 5962-94601）

1995-11-20

现行

MIL DSCC 5962-94586A

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE, OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-94586)
微电路、数字、高级双极CMOS、扫描测试设备、八进制总线收发器和寄存器、三态输出、TTL兼容输入、单片硅（取代DESC 5962-94586）

2007-05-03

现行

MIL DSCC 5962-94616A

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-94616)
微电路、数字、高级双极CMOS、带八进制总线收发器和寄存器的扫描测试设备、三态输出、TTL兼容输入、单片硅（取代DESC 5962-94616）

2007-05-30

现行

MIL DESC 5962-91727

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOP, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制D型边缘触发触发器的扫描测试设备 三态输出 单片硅

1994-01-14