首页 馆藏资源 舆情信息 标准服务 科研活动 关于我们
现行 MIL DESC 5962-91728 Notice A-Revision
到馆提醒
收藏跟踪
购买正版
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, MONOLITHIC SILICON 微电路 数字 双极CMOS 带八进制总线收发器的扫描测试设备 三态输出 单片硅
发布日期: 1994-05-02
分类信息
发布单位或类别: 美国-美国军事规范和标准
关联关系
研制信息
相似标准/计划/法规
现行
MIL DESC 5962-91728
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制总线收发器的扫描测试设备 三态输出 单片硅
1994-01-06
现行
MIL DESC 5962-94616
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS
微电路、数字、高级双极CMOS、带八进制总线收发器和寄存器的扫描测试设备、三态输出、TTL兼容输入
1994-04-26
现行
MIL DESC 5962-94615
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL REGISTERED BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS
微电路、数字、高级双极CMOS、带八进制注册总线收发器的扫描测试设备、三态输出、TTL兼容输入
1994-04-19
现行
MIL DESC 5962-94586
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS
微电路、数字、高级双极CMOS、带八进制总线收发器和寄存器的扫描测试设备、三态输出、TTL兼容输入
1994-04-22
现行
MIL DESC 5962-91726
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUFFER, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制缓冲器的扫描测试设备 三态输出 单片硅
1994-01-06
现行
MIL DESC 5962-93186
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
微电路、数字、高级双极CMOS、带三态输出的八进制总线收发器的扫描测试设备、TTL兼容输入、单片硅
1994-01-24
现行
MIL DESC 5962-93186 Notice A-Revision
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
微电路 数字 高级双极CMOS 扫描测试设备 带八路总线收发器 具有三态输出 TTL兼容输入 单片硅
1994-03-11
现行
MIL DESC 5962-91746
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUFFER, INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制缓冲器的扫描测试设备 反转三态输出 单片硅
1994-06-10
现行
MIL DESC 5962-91725
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE LATCH, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制D型锁存器的扫描测试设备 三态输出 单片硅
1994-01-06
现行
MIL DSCC 5962-93186B
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-93186)
微电路、数字、高级双极CMOS、带三态输出的八进制总线收发器的扫描测试设备、TTL兼容输入、单片硅(取代DESC 5962-93186)
2007-05-30
现行
MIL DSCC 5962-94586A
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE, OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-94586)
微电路、数字、高级双极CMOS、扫描测试设备、八进制总线收发器和寄存器、三态输出、TTL兼容输入、单片硅(取代DESC 5962-94586)
2007-05-03
现行
MIL DSCC 5962-94616A
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVER AND REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-94616)
微电路、数字、高级双极CMOS、带八进制总线收发器和寄存器的扫描测试设备、三态输出、TTL兼容输入、单片硅(取代DESC 5962-94616)
2007-05-30
现行
MIL DESC 5962-94672
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE
微电路、数字、高级双极CMOS、带18位通用总线收发器的扫描测试设备、三态输出、TTL兼容
1994-06-08
现行
MIL DSCC V62/04729
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
微电路 数字 先进双极CMOS 3.3伏ABT扫描测试设备 18位通用总线收发器 单片硅
2004-06-09
现行
MIL DSCC V62/04730
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
微电路 数字 先进双极CMOS 3.3伏ABT扫描测试设备 18位通用总线收发器 单片硅
2004-06-09
现行
MIL DESC 5962-91727
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOP, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微电路 数字 双极CMOS 带八进制D型边缘触发触发器的扫描测试设备 三态输出 单片硅
1994-01-14
现行
MIL DESC 5962-91727 Notice A-Revision
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOP, THREE-STATE OUTPUTS, MONOLITHIC SILICON
微型电路 数字 双极CMOS 带八进制D型边缘触发器的扫描测试设备 三态输出 单片硅
1994-05-02
现行
MIL DSCC V62/04731
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTERS, MONOLITHIC SILICON
微电路 数字 高级双极CMOS 3.3伏ABT扫描测试设备 带18位收发器和寄存器 单片硅
2004-06-09
现行
MIL DESC 5962-94601A
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-94601)
微电路、数字、高级双极CMOS、带18位总线收发器的扫描测试设备、三态输出、TTL兼容输入、单片硅(取代DESC 5962-94601)
1995-11-20
现行
MIL DSCC 5962-94672A
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-94672)
微电路、数字、高级双极CMOS、带18位通用总线收发器的扫描测试设备、三态输出、TTL兼容输入、单片硅(取代DESC 5962-94672)
2007-05-30