现行

IEC 60134-1961

Rating systems for electronic tubes and valves and analogous semiconductor devices
电子管和阀门和类似半导体器件的额定值系统

1961-01-01

现行

ECA/EIA 239

ELECTRICAL RATING SYSTEMS FOR ELECTRONIC TUBES
电子管的电气额定值系统

1979-09-01

现行

ECA/EIA TEP 137

DESIGN-MAXIMUM RATING SYSTEMS FOR ELECTRON TUBES
电子管最大额定值系统的设计

1981-10-01

现行

BS QC 720100-1991

Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
电子元件质量评定协调体系 半导体器件 光电器件分规范

1991-12-20

现行

BS QC 750100-1986+A2-1996

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
电子元件质量评定协调体系 分立半导体器件 分规范

2010-01-31

现行

BS QC 750100-1986

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
电子元件质量评定协调体系 分立半导体器件 分规范

1986-12-31

现行

BS CECC 50000-1987

Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
电子元件质量评定协调体系 总规范:分立半导体器件

1987-10-30

现行

BS QC 750114-1996

Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
电子元件质量评定协调体系 半导体器件 离散设备 场效应晶体管 开关用外壳额定场效应晶体管空白详细规范

1996-12-15

现行

BS QC 750103-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频放大的外壳额定双极晶体管

1990-02-15

现行

BS QC 750107-1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于高频放大的外壳额定双极晶体管

1991-11-15

现行

BS QC 750102-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频和高频放大的环境额定双极晶体管

1990-02-15

现行

BS QC 750106-1993

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于外壳额定功率放大器应用的场效应晶体管

1993-07-15

现行

IEC 62007-1-2015

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
用于光纤系统应用的半导体光电子器件 - 第1部分:基本等级和特性的规范模板

2015-03-30

现行

IEC 62007-1-2015+AMD1-2022 CSV

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
光纤系统用半导体光电器件.第1部分:基本额定值和特性的规范模板

2022-09-22

现行

BS EN 120000-1996

Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
电子元件质量评定协调体系 总规范:半导体光电和液晶器件

1996-09-15

现行

BS QC 750111-1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 双向三极晶闸管（TRIAC） 环境或外壳额定 高达100 A

1992-01-31

现行

BS QC 750110-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 反向阻断三极晶闸管 环境和外壳额定 高达100 A

1990-02-15

现行

IEC 62007-1-2015/AMD1-2022

Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
修改件1.光纤系统应用的半导体光电器件.第1部分:基本额定值和特性的规范模板

2022-09-22

现行

BS QC 720105-1997

Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems
电子元件质量评定协调体系 半导体器件 光电器件 光纤系统或子系统用带/不带引线的pin光电二极管空白详细规范

1997-08-15

现行

BS QC 750108-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 整流二极管（包括雪崩整流二极管） 环境和外壳额定 高达100 A

1990-02-15