Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
光学和光子学 - 全息术 - 第2部分:测量全息图记录特性的方法
发布日期:
2015-06-29
ISO 17901-2:2015规定了双光束干涉记录的全息图的曝光特性(曝光特性曲线、半最大曝光、R值、折射率调制幅度)的术语和测量方法。被测全息图的材料不限于任何特定的材料。ISO 17901-2:2015无意限制制造过程。
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.