现行

GB/T 31351-2014

碳化硅单晶抛光片微管密度无损检测方法
Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers

2014-12-31

现行

GB/T 30868-2014

碳化硅单晶片微管密度的测定 化学腐蚀法
Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching

2014-07-24

现行

GB/T 41765-2022

碳化硅单晶位错密度的测试方法
Test method for dislocation density of monocrystalline silicon carbide

2022-10-12

现行

GB/T 43313-2023

碳化硅抛光片表面质量和微管密度的测试 共焦点微分干涉法
Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics

2023-11-27

现行

GB/T 32278-2015

碳化硅单晶片平整度测试方法
Test methods for flatness of monocrystalline silicon carbide wafers

2015-12-10

现行

SJ/T 11499-2015

碳化硅单晶电学性能的测试方法
Test method for measuring electrical properties of monocrystalline silicon carbide

2015-04-30

现行

SJ/T 11501-2015

碳化硅单晶晶型的测试方法
Test method for determining crystal type of monocrystalline silicon carbide

2015-04-30

现行

GB/T 30866-2014

碳化硅单晶片直径测试方法
Test method for measuring diameter of monocrystalline silicon carbide wafers

2014-07-24

现行

SJ/T 11500-2015

碳化硅单晶晶向的测试方法
Test method for measuring crystallographic orientation of monocrystalline silicon carbide

2015-04-30

现行

SJ/T 11504-2015

碳化硅单晶抛光片表面质量的测试方法
Test method for measuring surface quality of polished monocrystalline silicon carbide

2015-04-30

现行

SJ/T 11503-2015

碳化硅单晶抛光片表面粗糙度的测试方法
Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers

2015-04-30

现行

GB/T 42271-2022

半绝缘碳化硅单晶的电阻率非接触测试方法
Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement

2022-12-30

现行

GB/T 30867-2014

碳化硅单晶片厚度和总厚度变化测试方法
Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers

2014-07-24

现行

GB/T 34520.3-2017

连续碳化硅纤维测试方法　第3部分：线密度和密度
Test methods for continuous silicon carbide fiber—Part 3:Linear density and density

2017-11-01