BS ISO 22489:2016规定了微米级测量中元素的量化要求 通过分析电子束产生的X射线确定的样本体积 使用安装在电子探针微分析仪或 扫描电子显微镜（SEM）。本国际标准还描述了以下内容:定量分析的原理；该技术在元素、质量分数和参考样品方面的总体覆盖范围；仪器的一般要求； 涉及的基本程序，如试样制备、实验材料的选择 条件、测量、分析和报告。本国际标准旨在对扁平均匀的块状物进行定量分析 使用正入射光束的试样。它没有详细说明这两个方面的要求 仪器或数据简化软件。操作员应获取安装等信息 制造商提供的仪器条件、详细操作程序和规格 使用的任何产品。交叉引用:ISO 14594ISO 14595ISO/IEC 17025:2005ISO 17470ISO 22309:2006ISO 23833购买本文件时提供的所有当前修订版均包含在购买本文件中。

BS ISO 22489:2016 specifies requirements for the quantification of elements in a micrometresized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).This International Standard also describes the following:the principle of the quantitative analysis;the general coverage of this technique in terms of elements, mass fractions and reference specimens;the general requirements for the instrument;the fundamental procedures involved such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these and the report.This International Standard is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used.Cross References:ISO 14594ISO 14595ISO/IEC 17025:2005ISO 17470ISO 22309:2006ISO 23833All current amendments available at time of purchase are included with the purchase of this document.