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现行 VDI/VDE 2655 Sheet 1.1
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Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement 光学测量和显微地形图.粗糙度测量用干涉显微镜和深度测量标准的校准
发布日期: 2008-03-01
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发布单位或类别: 德国-德国机械工程师协会
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