现行

KS C 7121(2016 Confirm)

발광 다이오드 (표시용) 측정방법
发光二极体(指示用)测量法

1990-12-20

现行

KS C 7120(2021 Confirm)

발광 다이오드 (표시용)
发光二极管（用于指示）

1990-12-20

现行

KS C 7120(2016 Confirm)

발광 다이오드 (표시용)
发光二极管（用于指示）

1990-12-20

现行

CID A-A-59781

LIGHT EMITTING DIODES FOR USE AS INDICATOR LIGHTS
用作指示灯的发光二极管

2005-10-25

现行

SJ/T 11394-2009

半导体发光二极管测试方法
Measure methods of semiconductor light emitting diodes

2009-11-17

现行

SJ/T 11399-2009

半导体发光二极管芯片测试方法
Measurement methods for chips of light emitting diodes

2009-11-17

现行

SJ/T 11471-2014

发光二极管外延片测试方法
Measurement methods for epitaxial wafers of light-emitting diodes

2014-10-14

现行

KS C 7104(2020 Confirm)

발광 다이오드(LED)의 성능 평가 방법
测量的发光二极管的性能的标准

2005-07-29

现行

CIE x048-OP43

ACCURATE MEASUREMENT OF ULTRAVIOLET LIGHT- EMITTING DIODES
紫外发光二极管的精确测量

2021-09-29

现行

JIS C 5951-1997

Measuring methods of light emitting diodes for fiber optic transmission
光纤传输用发光二极管的测量方法

1997-01-01

现行

GB/T 43787-2024

曲面有机发光二极管(OLED)光源光学性能测试方法
Measuring methods of optical performance for curved organic light emitting diode (OLED) lighting

2024-03-15

现行

BS IEC 60747-5-8-2019

Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
半导体器件

2019-11-27

现行

GOST R 8.749-2011

Государственная система обеспечения единства измерений. Светодиоды. Методы измерения фотометрических характеристик
确保测量一致性的状态系统 发光二极管 光度测量方法

现行

KS C 7116(2018 Confirm)

유기발광다이오드(OLED) 디스플레이－잔상 측정방법
有机发光二极管（OLED）显示器图像粘贴测量方法

2008-11-28

现行

KS C 7116(2023 Confirm)

유기발광다이오드(OLED) 디스플레이－잔상 측정방법
有机发光二极管显示器图像粘贴测量方法

2008-11-28

现行

GB/T 33762-2017

有机发光二极管（OLED）电视机显示性能测量方法
Method of measurement for display performance of organic light-emitting diode(OLED) television

2017-05-31

现行

BS EN 62341-6-3-2012

Organic light emitting diode (OLED) displays-Measuring methods of image quality
有机发光二极管（OLED）显示器

2012-10-31

现行

BS IEC 60747-5-11-2019

Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
半导体器件

2020-01-14

现行

GB/T 36613-2018

发光二极管芯片点测方法
Probe test method for light emitting diode chips

2018-09-17

现行

JIS C 8152-3-2013

Photometry of white light emitting diode for general lighting -- Part 3: measurement methods for lumen maintenance
普通照明用白光发光二极管的光度测定第3部分:流明维持的测量方法

2013-01-01