1.1 本试验方法包括评估和比较固体有机电介质材料对由于局部放电（电晕）和分子分解（发生在非常高的发散电场区域）而产生的管状树状通道的起始或生长或两者的电阻。 3. , 4. 1.2 本试验方法主要用于50或60 Hz的电源频率。 1.3 试验可以在室温或高于或低于室温的温度下进行。温度不得超过样品材料的软化点或熔点。 1.4 本试验方法可用于任何可铸造、模制或在模制后加热插入针头的固体材料。通过双针特征电压测量树木萌生电阻，该电压仅适用于非不透明材料，因此可以从光学角度观察树木。双针电压寿命报告了树木的萌生和生长阻力，适用于不透明和非不透明材料。 1.5 以国际单位制表示的数值应视为标准。 1.6 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.7 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 5.1 这是一项实验室测试，旨在模拟( 1. )在绝缘系统中，导体或半导体屏蔽和一次绝缘之间存在粗糙界面( 2. )绝缘系统中存在异物（污染物），以及( 3. )绝缘层内存在小空隙或空穴。 5.2 本试验方法提供了比较数据。尚未确定与实际服务绩效的相关程度。

1.1 This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiation or growth, or both, of tubular tree-like channels resulting from partial discharge (corona) and molecular decomposition that occur in the region of very high, diverging electric fields. 3 , 4 1.2 This test method is primarily for use at a power frequency of 50 or 60 Hz. 1.3 The test is able to be carried out at room temperature or temperatures above or below room temperature. The temperature shall not exceed the softening or melting point of the sample material. 1.4 This test method can be used for any solid material into which needles can be cast, molded, or inserted with heat after molding. The resistance to tree initiation is measured by the double-needle characteristic voltage, which is only applicable to non-opaque materials so that tree can be observed optically. The resistance to tree initiation and growth is reported by the double-needle voltage life, which is applicable to both opaque and non-opaque materials. 1.5 The values stated in SI units are to be regarded as the standard. 1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 5.1 This is a laboratory test designed to simulate the effects of ( 1 ) the presence of rough interfaces between conductor or semiconductive screen and primary insulation in an insulation system, ( 2 ) the presence of foreign particles (contaminants) in an insulation system, and ( 3 ) the presence of small voids or cavities within the insulation. 5.2 This test method provides comparative data. The degree of correlation with actual performance in service has not been established.