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现行 IEC 61788-7:2020 RLV
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Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies 超导性第7部分:电子特性测量微波频率下高温超导体的表面电阻
发布日期: 2020-03-20
IEC 61788-7:20 20 RLV包含官方IEC国际标准及其红线版本。Redline版本不是官方文档,它只有英文版本,为您提供了一种快速简单的方法来比较IEC官方标准与其以前版本之间的所有变化。 IEC 61788-7:20 20描述了通过标准双谐振器方法在微波频率下测量超导体的表面电阻(Rs)。测量的对象是谐振频率下Rs的温度依赖性。该方法Rs的适用测量范围如下: -频率:8GHz
IEC 61788-7:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is not an official document, it is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows:
- Frequency: 8 GHz < f < 30 GHz
- Measurement resolution: 0,01 m?at 10 GHz
The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added;
b) precision and accuracy statements have been converted to uncertainty;
c) reproducibility in surface resistant measurement has been added.
关联关系
研制信息
归口单位: TC 90
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