IEC 61788-15:2011-超导性 - 第15部分:电子特性测量 - 超导体薄膜在微波频率下的内在表面阻抗-国家数字标准馆

现行 IEC 61788-15:2011

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Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies 超导性 - 第15部分:电子特性测量 - 超导体薄膜在微波频率下的内在表面阻抗

发布日期： 2011-10-24

IEC 61788-15:20 11描述了通过改进的双谐振模式介质谐振器方法在微波频率下测量HTS膜的本征表面阻抗(Zs)。测量的目的是获得在谐振频率f0处的本征Zs的温度依赖性。

IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 29.050电气工程 - 导体材料

关联关系

研制信息

归口单位： TC 90

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