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RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT 基于失效风险和机会评估物理的半导体器件可靠性鉴定
发布日期: 2014-01-01
概述了一个概念,它主动地将资格认证集成到开发过程中,并提供了一个系统的程序作为开发的支持工具,并早期关注所需的活动。它结合风险和机遇评估步骤,将产品的要求转化为开发和鉴定措施,并伴随开发过程,作为高级质量规划和确认的指导和记录工具。收集的数据扩大了用于未来项目的DFR/BIR(可靠性设计/可靠性建筑)的知识数据库。该程序挑战并促进所有相关学科的团队合作。
A concept is outlined, which proactively integrates qualification into the development process and provides a systematic procedure as support tool to development and gives early focus on required activities. It converts requirements for a product into measures of development and qualification in combination with a risk and opportunity assessment step and accompanies the development process as guiding and recording tool for advanced quality planning and confirmation. The collected data enlarge the knowledge database for DFR / BIR (design for reliability / building-in reliability) to be used for future projects. The procedure challenges and promotes teamwork of all involved disciplines.
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