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现行 MIL DESC 5962-95525
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MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON 微电路 数字 CMOS 四电可擦除可编程电位器 单片硅
发布日期: 1995-02-10
分类信息
发布单位或类别: 美国-美国军事规范和标准
关联关系
研制信息
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微电路、存储器、数字、CMOS电可擦除可编程逻辑阵列、单片硅
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微电路、存储器、数字、CMOS电可擦除可编程逻辑阵列、单片硅
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MIL DESC 5962-93087A
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MIL MIL-M-38510/261 Notice 2-Validation 1
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MIL MIL-M-38510/260 Notice 2-Validation 1
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