Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
通过X射线反射计评估薄膜的厚度、密度和界面宽度 仪器要求、校准和定位、数据收集、数据分析和报告

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X-선 반사율(XRR) 측정법을 이용한 박막의 두께, 밀도, 계면 너비 평가 — 장치 요건, 정렬 및 위치결정, 데이터 수집, 데이터 분석, 보고
用X射线反射计评估薄膜的厚度、密度和界面宽度.仪器要求、校准和定位、数据收集、数据分析和报告

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Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
通过X射线反射法评估薄膜的厚度 密度和界面宽度 - 仪器要求 对准和定位 数据采集 数据分析和报告

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