Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems
光学和光子学 准备光学元件和系统的图纸 表面缺陷规范和测量系统
BS PD ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between
the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997,
specifically the dimensional method and the visibility method, and to provide information on how to
use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections
in the two systems.Cross References:ISO 14997:2017ISO 10110-7:2017ISO 10110-1:2006ISO 3All current amendments available at time of purchase are included with the purchase of this document.