MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
晶体管电容小值的测量
发布日期:
1967-02-01
本标准给出了一种使用三端电桥测量晶体管电容的测试方法,该电桥采用保护电路,消除了外部电容的影响。
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.