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CHIP CAPACITORS, MULTI-LAYER (CERAMIC DIELECTRIC) 多层片式电容器(陶瓷介质)
发布日期: 1987-01-01
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相似标准/计划/法规
现行
DOD DOD-C-55681/11
CAPACITORS, CHIP, MULTIPLE LAYER, FIXED, UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY STYLE CDR35 METRIC
已确立可靠性的陶瓷介质多层固定无封装片式电容器CDR35公制
1983-08-25
现行
MIL MIL-PRF-49464C Amendment 1
Capacitors, Chip, Single Layer, Fixed, Parallel Plate, Ceramic Dielectric, Established Reliability, General Specification for
已确定可靠性的陶瓷电介质单层固定平行板片式电容器通用规范
2017-07-28
现行
EIA 198-3-10
Multilayer (Monolithic), Uunencapsulated, Ceramic Dielectric, Surface-Mount Low Inductance Chip Capacitors and Multi-Terminal Low Inductance Capacitors
多层(单片)、封装、陶瓷介质、表面贴装低电感片式电容器和多端低电感电容器
2015-08-01
现行
SJ 20318-1993
CCK4103型有可靠性指标的非密封多层片状瓷介固定电容器详细规范
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CCK4103
1993-05-11
现行
SJ 20314-1993
CTK4104型有可靠性指标的非密封多层片状瓷介固定电容器详细规范
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CTK4104
1993-05-11
现行
SJ 20313-1993
CTK4103型有可靠性指标的非密封多层片状瓷介固定电容器详细规范
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CTK4103
1993-05-11
现行
SJ 20312-1993
CTK4102型有可靠性指标的非密封多层片状瓷介固定电容器详细规范
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CTK4102
1993-05-11
现行
SJ 20311-1993
CCK4104型有可靠性指标的非密封多层片状瓷介固定电容器详细规范
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability Type CCK4104
1993-05-11
现行
SJ 20203-1992
CTK4101型有可靠性指标的非密封多层片状瓷介固定电容器详细规范
Detail specification capacitors, chip, multiple layer, fixed, unencapsulated, ceramic dielectric, established reliability, Type CTK4101
1992-11-19
现行
MIL MIL-PRF-55681G Supplement 1
Capacitor, Chip, Multiple Layer, Fixed Ceramic Dielectric, Established Reliability and Non-Established Reliability, General Specification for
确定可靠性和非确定可靠性的多层固定陶瓷电介质芯片电容器通用规范
2016-07-12
现行
MIL MIL-PRF-55681/3E Notice 1-Validation
Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR06
电容器芯片多层固定陶瓷介质既定可靠性与非既定可靠性CDR06
2011-10-20
现行
MIL MIL-PRF-55681/2D Notice 1-Validation
Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR05
CDR05型已确定可靠性和未确定可靠性的多层固定陶瓷电介质芯片电容器
2011-10-20
现行
MIL MIL-PRF-55681/2D Notice 2-Validation
Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR05
CDR05型已确定可靠性和未确定可靠性的多层固定陶瓷电介质芯片电容器
2016-07-26
现行
MIL MIL-PRF-55681/3E Notice 2-Validation
Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR06
CDR06型既定可靠性和非既定可靠性多层固定陶瓷电介质芯片电容器
2016-07-26
现行
MIL MIL-PRF-55681/2D-Notice 2-Validation
Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR05
CDR05型已确定可靠性和未确定可靠性的多层固定陶瓷电介质芯片电容器
2016-07-26
现行
MIL MIL-PRF-49464/1C Notice 1-Validation 1
Capacitors, Chip, Single Layer, Fixed Unencapsulated, Ceramic Dielectric, Established Reliability, Style CPCR01 (High Frequency)
CPCR01型(高频)陶瓷电介质固定式单层芯片电容器
2016-03-22
现行
MIL MIL-PRF-55681G
Capacitor, Chip, Multiple Layer, Fixed Ceramic Dielectric, Established Reliability and Non-Established Reliability, General Specification for
片式多层固定陶瓷电介质电容器 既有可靠性和非既有可靠性 通用规范
2016-07-12
现行
MIL MIL-PRF-55681/13
Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR37
电容器 芯片 多层 固定 陶瓷介质 既有可靠性和非既有可靠性 CDR37型
2016-07-12
现行
MIL MIL-PRF-55681/12
Capacitor, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR36
电容器 芯片 多层 固定 陶瓷介质 既有可靠性和非既有可靠性 CDR36型
2016-07-12
现行
MIL MIL-PRF-55681/8C Notice 1-Validation
Capacitors, Chip, Multiple Layer, Fixed, Ceramic Dielectric, Established Reliability and Non-Established Reliability, Style CDR32, Metric
CDR32型固定多层陶瓷介质芯片电容器 确定可靠性和非确定可靠性 公制
2011-10-20